| Mfg Part Number: 15-1326286-1 | Alternate P/N: 1513262861 | NSN : 5962-01-375-7492 |
| NIIN : 013757492 | CAGE Code : 0BDC6 | Manufacturer: Gte Corp |
| Item Name : Microcircuit Memory | FSC : 5962 Microcircuits Electronic |
Thank you for your continued interest in the parts associated with the NSN 5962-01-375-7492, those of which are readily available for purchase on Automatize Electronics. The Microcircuit Memory item associated with the part number 15-1326286-1, by Gte Corp, is currently available on our database; thus, if you wish to begin the part number 15-1326286-1 procurement process, we ask that you please fill out and submit an Instant RFQ form detailing your requirements on parts needed. This includes desired quantities, target prices, expected shipping time frames, and more, as applicable. Upon receival, our representatives will harness your provided information and formulate a solution which satisfies your operational needs in just 15 minutes or less.
With our global supply chain stretching across the United States, Canada, and the United Kingdom, Automatize Electronics can provide expedited shipping on select NSN products with the CAGE Code 0BDC6, strategically assisting entities facing an Aircraft on Ground (AOG) situation or other unique time constraint. Operating with a strict NO CHINA SOURCING pledge, all items are shipped alongside their manufacturer trace documentation or qualifying certifications, ensuring that customers feel confident in every purchase made. With cost savings and rapid lead times bolstering every order, experience all of what Automatize Electronics has to offer on products with the NSN 5962-01-375-7492 by submitting your RFQ for parts by Gte Corp. submit a quote for the part number 15-1326286-1, today!
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item Description: Microcircuit Memory | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AGAV | End Item Identification | HAC/RMPE REACT BASIC |
| NHCF | Nuclear Hardness Critical Feature | HARDENED |
| CZZZ | Memory Capacity | 128K X 8 |
| CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
| CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CZER | Memory Device Type | EPROM |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
| ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
| CQSJ | Inclosure Material | CERAMIC |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MRC | Decoded Requirement | Clear Text Reply |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | FEAT |
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