Microcircuit Memory Thank you for your interest in NSN 5962-01-375-7492 part on this page, you can find our complete list of featured parts with NSN 5962-01-375-7492 including highly-sought-after options like 15-1326286-1, alongside many others. Our NSN 5962-01-375-7492 parts catalog is backed by a widespread supply network which ensures convenient solutions to all your operational requirements and AOG situations. Furthermore, to ensure the quality of our components we ship orders alongside their manufacturer trace documents and qualifying certifications as applicable. Upon finding one or more items of interest, you may start the purchasing process today by submitting a completed RFQ form. We only ask that you provide as much detail as you can, such as quantity and estimated shipping deadline so we can formulate a solution best fit to your situation. Upon receiving your request, a dedicated member of our team will reply with a quote that is tailored to your specific needs in just 15 minutes or less!
Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
NIIN | 01-375-7492 (013757492) |
NCB Code | USA (01) |
Part No | Manufacturer | Item Name | QTY | RFQ |
---|---|---|---|---|
15-1326286-1 | gte government systems corp | microcircuit memory | Avl | RFQ |
15-1326286-1 | gte corp | microcircuit memory | Avl | RFQ |
15-1326286-1 | advanced micro devices inc | microcircuit memory | Avl | RFQ |
15-1326286-1 | general dynamics corporation | microcircuit memory | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
AGAV | End Item Identification | HAC/RMPE REACT BASIC |
NHCF | Nuclear Hardness Critical Feature | HARDENED |
CZZZ | Memory Capacity | 128K X 8 |
CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
CZER | Memory Device Type | EPROM |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
CQSJ | Inclosure Material | CERAMIC |
CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
MRC | Decoded Requirement | Clear Text Reply |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CWSG | Terminal Surface Treatment | SOLDER |
CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | Criticality Code Justification | FEAT |
5905-00-000-0136 (5905000000136) | 5905-00-001-2573 (5905000012573) | 5905-00-001-2813 (5905000012813) | 5905-00-001-2834 (5905000012834) |
5905-00-001-2852 (5905000012852) | 5905-00-001-2882 (5905000012882) | 5905-00-001-2890 (5905000012890) | 5905-00-001-2920 (5905000012920) |
5905-00-001-2934 (5905000012934) | 5905-00-001-2951 (5905000012951) | 5905-00-001-2952 (5905000012952) | 5905-00-001-2954 (5905000012954) |
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